Normalization of Angular Range

Published May 1st, 2025 by Maxwell Terban

Wavelength Dependence It is important to know that the angular range of a diffraction pattern (2θ) depends on the wavelength λ of the X-rays used in the measurement. Measurements made using laboratory diffractometers use the characteristic emissions of a metal anode, e. g. Copper or Cobalt K-alpha (λ = 1.540596 or 1.788965, respectively). In our mea

SAXS—applications

Published March 30th, 2025 by Maxwell Terban

Small-angle X-ray scattering (SAXS) Small-angle X-ray scattering probes the material over very low spatial frequencies. This allows observations of in­ho­mo­ge­neity or periodicity in the density, which can be particularly useful for identifying microphase segregation or mesoporosity. It also can give information about domain morphology and size, fo

Instrumental Resolution Functions

Published June 12th, 2025 by Maxwell Terban

Obtaining the instrumental profile The instrumental profile function or instrumental resolution function (IRF) is a critical starting point for modeling methods that rely on refinement against the observed powder diffraction pattern. In principle, the profile parameters can be fitted to any measurement profile, however, it is usually desired to obta

Our Beamtime Calendar

Published March 4th, 2025 by Maxwell Terban

Data formats

Published July 8th, 2025 by Maxwell Terban

Download folder When you download the data from our data portal, you will receive a compressed zip-folder. To open the zip files containing your measurement results, you can use any standard file compression/extraction program. Common options include: Windows Explorer (built-in on most Windows operating systems) WinZip or 7-Zip for Windows The built

General Terms and conditions

Published April 29th, 2025 by Maxwell Terban

SAXS—measurement data

Published March 30th, 2025 by Maxwell Terban

Raw Data Measured intensities were collected using a Pilatus CdTe 2M detector (1679 × 1475 pixels, 172 × 172 µm2 each) positioned with the incident beam in the corner of the detector. The sample-to-detector distance was approximately 7.1 m for the small-angle scattering measurements. Calibration is performed using silver behenate. Geometry calibrati

XRPD—applications

Published March 30th, 2025 by Maxwell Terban

High-resolution X-ray powder diffraction (HR-XRPD) X-ray powder diffraction is ideal for identification, refinement, and solution of microcrystalline structures. This technique provides a rapid diagnostic for detecting impurities, quantifying phases, determining molecular-scale and morphological properties of matter, and much more. Key advantages: F

XRPD—measurement specs

Published March 30th, 2025 by Maxwell Terban

Detector Pilatus3 X CdTe 2M Beam position on corner of detector (quarter detector) Minimum energy threshold 37.5 keV Detector distance 1.5 m Wavelength / Energy 0.165 Å / 75.0 keV Beam size ⌀ 0.05–0.075 mm  Focusing on detector via transfocator Q -range 0.16–9.1 Å-1 d -spacing 40–0.69 Å Peak resolution 0.004 Å-1 (first peak integral breadth for LaB6

Metadata Tracking

Published April 17th, 2025 by Maxwell Terban

When defining samples in the Momentum Transfer App, there are two categories of information to be entered. The first is for registering samples for measurement and is accessed when a sample is created, or by selecting an existing sample and clicking “Edit” to update sample identification, composition, and safety information. The second category of i

TSPDF—measurement data

Published March 30th, 2025 by Maxwell Terban

Raw Data Measured intensities were collected using a Pilatus CdTe 2M detector (1679 × 1475 pixels, 172 × 172 µm2 each) positioned with the incident beam in the corner of the detector. The sample-to-detector distance was approximately 0.3 m for the total scattering measurements. Calibration is performed using NIST SRM 660b (LaB6). Geometry calibratio

SAXS—measurement specs

Published March 30th, 2025 by Maxwell Terban

Detector Pilatus3 X CdTe 2M Flight tube Placed along beam-path after sample to minimize air scattering background Beam position on center of detector (full detector) Minimum energy threshold 37.5 keV Detector distance 7.1 m Wavelength / Energy 0.165 Å / 75.0 keV Beam size ⌀ 0.05–0.075 mm  Focusing on detector via transfocator Q -range 0.01–0.78 Å-1

Consulting Services

Published March 4th, 2025 by Maxwell Terban

We assist users in various scientific endeavors. We can help determine the optimal measurements needed to solve their scientific problems and provide guidance on data interpretation to help users make sense of their findings. We specialize in performing structure refinement, utilizing methods such as Rietveld refinement Real-space refinement. Furthe

Reference Measurements

Published March 5th, 2025 by Maxwell Terban

You don’t need to worry about reference or background measurements. This is already part of our default experimental protocol; we automatically measure a set of NIST reference standards incuding the following: LaB6 SRM 660b NIST Certificate High-resolution, Intensities(2 θ)     Total scattering, Intensities(2 θ)     Total scattering structure functi

Facilities

Published March 4th, 2025 by Maxwell Terban

Operations at the European Synchrotron Radiation Facility (ESRF) We currently use beamline ID31 at the ESRF for running high-throughput powder diffraction and scattering measurements. The ESRF is the highest brilliance high energy synchrotron in the world. In particular, beamline is ideal for our measurements due to providing high flux at our high w

How we Handle Air Sensitive Samples

Published March 5th, 2025 by Maxwell Terban

For air sensitive materials, the handling of samples during storage, shipment, and measurement should be carefully considered depending on the possibility for sample degradation under ambient conditions. e sample holders discussed above as-is are not specifically designed to be sealed against oxygen or moisture from the air. Nevertheless, we have te

XRPD—measurement data

Published March 30th, 2025 by Maxwell Terban

Raw Data Measured intensities were collected using a Pilatus CdTe 2M detector (1679 × 1475 pixels, 172 × 172 µm2 each) positioned with the incident beam in the corner of the detector. The sample-to-detector distance was approximately 1.5 m for the high-resolution measurements. Calibration is performed using NIST SRM 660b (LaB6). Geometry calibration

TSPDF—measurement specs

Published March 30th, 2025 by Maxwell Terban

Total scattering Detector Pilatus3 X CdTe 2M Beam position on corner of detector (quarter detector) Minimum energy threshold 37.5 keV Detector distance 0.3 m Wavelength / Energy 0.165 Å / 75.0 keV Beam size ⌀ 0.05–0.075 mm  Focusing on detector via transfocator Q -range 0.32–31 Å-1 d -spacing 20–0.2 Å Peak resolution 0.02 Å-1 (first peak integral br

TSPDF—applications

Published March 30th, 2025 by Maxwell Terban

Total Scattering Pair Distribution Function (TS-PDF) Analysis Total scattering goes beyond typical assessment of diffraction peaks to consider the diffuse intensities scattered underneath and in between. These carry further information about defects, disorder, dynamics, and morphology that underpin functional properties. The pair distribution functi

Publications

Published March 4th, 2025 by Maxwell Terban

2025  ALLOYS  14. High-Entropy V-Based Null Matrix Alloys─Short/Long-Range Structural Features, Chemical Stabilities, and Mechanical Properties,  Man He, Chen Wang, Hua Yang, Dong-Ying Wu, Jey-Jau Lee, Xuan Huang, Hao Shen, Fangwei Wang, Maxim Avdeev, Wang Hay Kan, ACS Appl. Eng. Mater., 2025, X, XX, XXXX–XXXX View Publication   ELECTROCATALYSTS  13