Table of Contents
Raw Data
Measured intensities were collected using a Pilatus CdTe 2M detector (1679 × 1475 pixels, 172 × 172 µm2 each) positioned with the incident beam in the corner of the detector. The sample-to-detector distance was approximately 7.1 m for the small-angle scattering measurements.
Calibration is performed using silver behenate. Geometry calibration is performed using the software pyFAI followed by image integration including corrections for flat-field response, geometry, solid-angle, and polarization. All submodules have been calibrated to correct for small distortions of submodule positions, and a mask is applied to remove invalid pixels.
Integrated data
Raw data are integrated onto 3000 bin grid using a sigma_clipping algorithm to mask azimuthal outliers. The data are background subtracted. Below we show exemplary small-angle scattering patterns for silver behenate and for a thermoplastic polyurethane, showing microphase segregation between molecular components.
Rietveld refinement / Instrumental profile determination
Rietveld refinement is performed using TOPAS v7 to validate the geometry calibration.
Data download structure
/references/saxs/
{ reference sample }.integrated.summed.2th.xye |
integrated dataset |
{ reference sample }.integrated.summed.subtracted_bkg.2th.xye |
background subtracted data |
| { reference sample }.integrated.summed.subtracted_bkg.corr.2th.xye | polynomial offset corrected data |
/samples/saxs/
{ sample }.integrated.summed.2th.xye |
integrated dataset |
{ sample }.integrated.summed.subtracted_bkg.2th.xye |
background subtracted data |
| { sample }.integrated.summed.subtracted_bkg.corr.2th.xye | polynomial offset corrected data |