What is the experimental setup and data processing details?

The high-resolution synchrotron X-ray diffraction and total scattering measurements are performed at beamline ID31 at the European Synchrotron Radiation Facility (ESRF) using an incident X-ray energy of 75.051 keV (λ = 0.16520 Å). Sample powders are loaded into cylindrical slots (approx. 1 mm thickness) held between Kapton windows in a high-throughput sample holder. Measurements are conducted in transmission geometry using a Pilatus CdTe 2M detector positioned with the incident beam in the corner of the detector. The sample-to-detector distance is approximately 1.5 m for high-resolution measurements, 0.3 m for total scattering measurements, and 7 m for small-angle scattering. Background measurements for the empty windows are measured and subtracted. NIST SRM 660b (LaB₆) is used for geometry calibration performed with pyFAI software followed by image integration including flat-field, geometry, solid-angle, and polarization corrections. Automated background subtraction is taken and parallax correction is performed based on Rietveld refinement of LaB₆ 660b. Preliminary pair distribution functions are generated using PDFgetX3 with preset Qmax ranges, Qmax-inst., and a reasonable starting guess for r-poly.