SAXS—measurement data

Raw Data

Measured intensities were collected using a Pilatus CdTe 2M detector (1679 × 1475 pixels, 172 × 172 µm² each) positioned with the incident beam in the corner of the detector. The sample-to-detector distance was approximately 7.1 m for the small-angle scattering measurements.

Calibration is performed using silver behenate. Geometry calibration is performed using the software pyFAI followed by image integration including corrections for flat-field response, geometry, solid-angle, and polarization. All submodules have been calibrated to correct for small distortions of submodule positions, and a mask is applied to remove invalid pixels.

Integrated data

Raw data are integrated onto 3000 bin grid using a sigma_clipping algorithm to mask azimuthal outliers. The data are background subtracted. Below we show exemplary small-angle scattering patterns for silver behenate and for a thermoplastic polyurethane, showing microphase segregation between molecular components.

Rietveld refinement / Instrumental profile determination

Rietveld refinement is performed using TOPAS v7 to validate the geometry calibration.

Data download structure

/references/saxs/

/samples/saxs/