You don’t need to worry about reference or background measurements. This is already part of our default experimental protocol; we automatically measure a set of NIST reference standards incuding the following:
LaB6 SRM 660b
High-resolution, Intensities(2θ)
Total scattering, Intensities(2θ)
Total scattering structure function, F(Q)
Pair distribution function, G(r)
CeO2 SRM 674a
High-resolution measurement, Intensities(2θ)
Total scattering measurement, Intensities(2θ)
Total scattering structure function, F(Q)
Pair distribution function, G(r)
TiO2 SRM 674a
High-resolution measurement, Intensities(2θ)
Total scattering measurement, Intensities(2θ)
Total scattering structure function, F(Q)
Pair distribution function, G(r)
ZnO SRM 674a
High-resolution measurement, Intensities(2θ)
Total scattering measurement, Intensities(2θ)
Total scattering structure function, F(Q)
Pair distribution function, G(r)
Si SRM 640c
High-resolution measurement, Intensities(2θ)
Total scattering measurement, Intensities(2θ)
Total scattering structure function, F(Q)
Pair distribution function, G(r)
Background Measurement
We take duplicate measurements of the empty sample well with polyimide windows.