You don’t need to worry about reference or background measurements. This is already part of our default experimental protocol; we automatically measure a set of NIST reference standards incuding the following:
LaB6 SRM 660b
High-Resolution, Intensities(2θ)
Total Scattering, Intensities(2θ)
Total Scattering Structure Function, F(Q)
Pair Distribution Function, G(r)
CeO2 SRM 674a
High-Resolution Measurement, Intensities(2θ)
Total Scattering Measurement, Intensities(2θ)
Total Scattering Structure Function, F(Q)
Pair Distribution Function, G(r)
TiO2 SRM 674a
High-Resolution Measurement, Intensities(2θ)
Total Scattering Measurement, Intensities(2θ)
Total Scattering Structure Function, F(Q)
Pair Distribution Function, G(r)
ZnO SRM 674a
High-Resolution Measurement, Intensities(2θ)
Total Scattering Measurement, Intensities(2θ)
Total Scattering Structure Function, F(Q)
Pair Distribution Function, G(r)
Si SRM 640c
High-Resolution Measurement, Intensities(2θ)
Total Scattering Measurement, Intensities(2θ)
Total Scattering Structure Function, F(Q)
Pair Distribution Function, G(r)
Background Measurement
We take duplicate measurements of the empty sample well with polyimide windows.